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IµSHigh Brilliance

IµSHigh Brilliance for Cu, Mo and Ag

IµSHigh Brilliance and the 19" generator IG350

Memory chips are built into tube mount for recording the real-time status of the component.



IµS 2.0 = IµS High Brilliance -

The high-end Incoatec microfocus X-ray source for unique efficiency and brightness

In 2011 - five years after the successful launch of the IμS - we introduced the next generation of Microfocus Sources: the Incoatec Microfocus Source IμSHigh Brilliance!
Its outstanding performance raised the standard of low-maintenance sealed tube solutions for crystallography, available for Cu, Mo, Ag, Cr and Co radiation. Compared to the original IμS, the IμSHigh Brilliance shows an increase in intensity of about 30 % for Cu, 50 % for Ag and 60 % for Mo. The IμSHigh Brilliance perfectly matches the new Bruker AXS D8 crystallography solutions. In 2015, the 500th IμS was sold.

What´s different?
The improved heat-management makes it possible to produce more photons in the same small spot. Tried and trusted, our state-of-the-art Quazar multilayer optics are ideal for 2-dim focusing or collimating. Of course, the IμSHigh Brilliance includes all familiar advantages of our previous IμS systems: air-cooling, no moving parts, long lifetime without maintenance and 3 years warranty.
Furthermore, memory chips are built into tube, tube mount and optics, recording the real-time status of the components (“DAVINCI” design). These data allow for easier installation and change of components, and can be accessed online, making remote diagnostics faster, better and easier. The result is an absolutely reliable system. The IμS fulfills highest safety standards: radiation safe, vacuum tested and fully compliant with Machinery Directive 2006/42/EC.

The comparison of the intensity of the original IμS and the IμSHigh Brilliance shows an increase in intensity of about 30 % for Cu, 50 % for Ag and 60 % for Mo.

Section of the diffaction pattern of an Ylid crystal (C11H10O2S, 0.16 x 0.12 x 0.12 mm3, 2s/0.5° exposure time, h0l layer) recorded with an IμSHigh Brilliance (left) and a classic IμS (right).

Technical details IµS and generator

IµS     Generator 19 inch  
Length 239 mm   High voltage ≤ 50 kV
Height 288 mm   Current ≤ 1000 µA
Width 60 mm   Power ≤ 50 W
Weight 7.2 kg   Weight 8.5 kg


With a peak flux density of more than 2∙109 photons/(s mm2) the Mo-IμSHigh Brilliance enables scientists in small molecule and high-resolution crystallography to collect better data sets in shorter time. Measurements in the Incoatec AppLab with a Bruker D8 show an increase of more than 60 % in the diffracted intensity.
The compact design makes the IμSHigh Brilliance an attractive component for many academic and industrial research organizations to upgrade existing X-ray analytical instruments to cutting-edge performance.

Source IµS High Brilliance IµS classic
< I > 2927.2 1778.5
Resolution [Å] 0.83 (0.92-0.83) 0.83 (0.92-0.83)
< I/σ > 37.9 (8.7) 31.8 (6.5)
R (int); R(σ) [%] 3.39; 1.50 4.17; 1.81
R1; wR2 [%] 3.13; 8.80 3.58; 10.00
d (C2-C3) [Å] 1.368(3) 1.363(4)

Statistics of the two data sets from the Ylid crystal


Since its introduction in 2006, the IµS defines the gold-standard for microfocus X-ray sources used for a large variety of applications in biology, chemistry, physics and material science, such as